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 SEMIX302GAR12E4S
Absolute Maximum Ratings Symbol
IGBT VCES IC ICnom ICRM ICRM = 3xICnom VCC = 800 V VGE 20 V VCES 1200 V VGES tpsc Tj Inverse diode IF
SEMIX302GAR12E4S
Conditions
Values
1200
Unit
V A A A A V s C A A A A A C A A A A A C A C V
Tj = 175 C
Tc = 25 C Tc = 80 C
463 356 300 900 -20 ... 20
SEMiX(R)2s
Trench IGBT Modules
Tj = 150 C
10 -40 ... 175
Tj = 175 C
Tc = 25 C Tc = 80 C
356 266 300 900 1620 -40 ... 175
IFnom
Features
* Homogeneous Si * Trench = Trenchgate technology * VCE(sat) with positive temperature coefficient * High short circuit capability * UL recognised file no. E63532
IFRM IFSM Tj
IFRM = 3xIFnom tp = 10 ms, sin 180, Tj = 25 C
Freewheeling diode IF IFnom IFRM IFSM Tj Module It(RMS) Tstg Visol AC sinus 50Hz, t = 1 min 600 -40 ... 125 4000 IFRM = 3xIFnom tp = 10 ms, sin 180, Tj = 25 C Tj = 175 C Tc = 25 C Tc = 80 C 356 266 300 900 1620 -40 ... 175
Typical Applications
* AC inverter drives * UPS * Electronic Welding
Remarks
* Case temperature limited to TC=125C max. * Product reliability results are valid for Tj=150C * Dynamic values apply to the following combination of resistors: RGon,main = 0,5 RGoff,main = 0,5 RG,X = 2,2 RE,X = 0,5
Characteristics Symbol
IGBT VCE(sat) VCE0 rCE VGE(th) ICES Cies Coes Cres QG RGint IC = 300 A VGE = 15 V chiplevel Tj = 25 C Tj = 150 C Tj = 25 C Tj = 150 C VGE = 15 V Tj = 25 C Tj = 150 C 5 Tj = 25 C Tj = 150 C f = 1 MHz f = 1 MHz f = 1 MHz 18.6 1.16 1.02 1700 2.50 1.8 2.2 0.8 0.7 3.3 5.0 5.8 0.1 2.05 2.4 0.9 0.8 3.8 5.3 6.5 0.3 V V V V m m V mA mA nF nF nF nC
Conditions
min.
typ.
max.
Unit
VGE=VCE, IC = 12 mA VGE = 0 V VCE = 1200 V VCE = 25 V VGE = 0 V VGE = - 8 V...+ 15 V Tj = 25 C
GAR (c) by SEMIKRON Rev. 1 - 20.02.2009 1
SEMIX302GAR12E4S
Characteristics Symbol
td(on) tr Eon td(off) tf Eoff Rth(j-c)
Conditions
VCC = 600 V IC = 300 A Tj = 150 C Tj = 150 C Tj = 150 C
min.
typ.
282 60 30 564 117 44
max.
Unit
ns ns mJ ns ns mJ
RG on = 1.9 Tj = 150 C RG off = 1.9 di/dton = 5000 A/s Tj = 150 C di/dtoff = 2800 A/s Tj = 150 C per IGBT Tj = 25 C Tj = 150 C Tj = 25 C Tj = 150 C Tj = 25 C Tj = 150 C IF = 300 A Tj = 150 C di/dtoff = 4300 A/s T = 150 C j VGE = -15 V Tj = 150 C VCC = 600 V per diode Tj = 25 C Tj = 150 C Tj = 25 C Tj = 150 C Tj = 25 C Tj = 150 C IF = 300 A Tj = 150 C di/dtoff = 4300 A/s T = 150 C j VGE = -15 V Tj = 150 C VCC = 600 V per diode 1.1 0.7 2.2 3.3 1.1 0.7 2.2 3.3
0.096 2.1 2.1 1.3 0.9 2.8 3.9 230 50 19 0.17 2.1 2.1 1.3 0.9 2.8 3.9 230 50 19 0.17 18 2.5 2.4 1.5 1.1 3.2 4.3 2.46 2.4 1.5 1.1 3.2 4.3
K/W V V V V m m A C mJ K/W V V V V m m A C mJ K/W nH m m K/W
SEMiX 2s
Trench IGBT Modules
SEMIX302GAR12E4S
(R)
Inverse diode VF = VEC IF = 300 A VGE = 0 V chip VF0 rF IRRM Qrr Err Rth(j-c)
Features
* Homogeneous Si * Trench = Trenchgate technology * VCE(sat) with positive temperature coefficient * High short circuit capability * UL recognised file no. E63532
Typical Applications
* AC inverter drives * UPS * Electronic Welding
Freewheeling diode VF = VEC IF = 300 A VGE = 0 V chip VF0 rF IRRM Qrr Err Rth(j-c) Module LCE RCC'+EE' Rth(c-s) Ms Mt w Temperatur Sensor R100 B100/125 res., terminal-chip per module to heat sink (M5)
Remarks
* Case temperature limited to TC=125C max. * Product reliability results are valid for Tj=150C * Dynamic values apply to the following combination of resistors: RGon,main = 0,5 RGoff,main = 0,5 RG,X = 2,2 RE,X = 0,5
TC = 25 C TC = 125 C 3 to terminals (M6) 2.5
0.7 1 0.045 5 5 250
Nm Nm Nm g K
Tc=100C (R25=5 k) R(T)=R100exp[B100/125(1/T-1/T100)]; T[K];
493 5% 3550 2%
GAR 2 Rev. 1 - 20.02.2009 (c) by SEMIKRON
SEMIX302GAR12E4S
Fig. 1: Typ. output characteristic, inclusive RCC'+ EE'
Fig. 2: Rated current vs. temperature IC = f (TC)
Fig. 3: Typ. turn-on /-off energy = f (IC)
Fig. 4: Typ. turn-on /-off energy = f (RG)
Fig. 5: Typ. transfer characteristic
Fig. 6: Typ. gate charge characteristic
(c) by SEMIKRON
Rev. 1 - 20.02.2009
3
SEMIX302GAR12E4S
Fig. 7: Typ. switching times vs. IC
Fig. 8: Typ. switching times vs. gate resistor RG
Fig. 9: Typ. transient thermal impedance
Fig. 10: Typ. CAL diode forward charact., incl. RCC'+EE'
Fig. 11: Typ. CAL diode peak reverse recovery current
Fig. 12: Typ. CAL diode recovery charge
4
Rev. 1 - 20.02.2009
(c) by SEMIKRON
SEMIX302GAR12E4S
SEMiX 2s
GAR
This is an electrostatic discharge sensitive device (ESDS), international standard IEC 60747-1, Chapter IX This technical information specifies semiconductor devices but promises no characteristics. No warranty or guarantee expressed or implied is made regarding delivery, performance or suitability.
(c) by SEMIKRON
Rev. 1 - 20.02.2009
5


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